[27a-PB2-1~24] 6.3 Oxide-based electronics

[27a-PB2-21] Clarification of Cu migration path in conducting-bridge memory

^○Sho Yura¹, Kentaro Kinoshita^1,2, Takahiro Yamasaki³, Satoru Kishida^1,2, Kengo Nakada¹, Akira Ishii¹ (Tottori Univ.¹, Tottori Univ. Electronic Display Research Center², FUJITSU Lab. Ltd³)

Keywords:HfO2、第一原理計算