[27p-A6-1~16] 6.2 Carbon-based thin films

[27p-A6-11] Breakdown Voltage Evaluation of Diamond Lateral Junction Devices

^○Kazuki Sato¹, Takayuki Iwasaki¹, Yuto Hoshino¹, Hiromitsu Kato², Toshiharu Makino², Masahiko Ogura², Daisuke Takeuchi², Hideyo Ohkushi², Satoshi Yamasaki², Mutsuko Hatano¹ (Tokyotech¹, aist²)

Keywords:diamond-semiconductor