The 60th JSAP Spring Meeting,2013

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Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[27p-F2-1~15] 6.3 Oxide-based electronics

Wed. Mar 27, 2013 1:30 PM - 5:30 PM F2 (E3 3F-303)

[27p-F2-12] Distributions of forming characteristics in Pt/NiO/Pt stack structures

○Yusuke Nishi1, Tatsuya Iwata1, Tsunenobu Kimoto1 (Kyoto Univ.1)

Keywords:抵抗変化メモリ