[28p-G7-1~13] 13.7 Simulation

[28p-G7-10] Device Simulation of Gate-all-around Schottky Barrier Tunnel FET Considering Image Force Effects

^○Shuichiro Hashimoto¹, Yuji Kawamura¹, Yasuhiro Shikahama¹, Takefumi Kamioka^1,2, Takanobu Watanabe^1,2 (Waseda Univ.¹, CREST-JST²)

Keywords:鏡像効果、ショットキー障壁、トンネルFET