The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

16. Amorphous and Microcrystalline Materials » 16.2 Processing technologies and devices

[29a-A3-1~7] 16.2 Processing technologies and devices

Fri. Mar 29, 2013 10:15 AM - 12:00 PM A3 (K1 2F-201)

[29a-A3-4] Characteristics of Ge Films Inserted with Thin Si layer for Infrared Bolometer Sensor

Junichi Kinoshita1, Ryou Takeuchi1, Yuhei Nakamura1, Akio Furukawa1 (Tokyo University of Science1)

Keywords:ボロメーター、赤外線、センサー