The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

08. Plasma Electronics » 8.2 Plasma measurements and diagnostics

[29a-B8-1~10] 8.2 Plasma measurements and diagnostics

Fri. Mar 29, 2013 9:00 AM - 11:45 AM B8 (K2 4F-1406)

[29a-B8-3] LIF Observation of the Etching Products in the Inward-Plasma

Jun Miyawaki1, Atsushi Ando1, Toshitaka Kubo1, Tomoyuki Horie1, Miyuki Tanaka1, Satoshi Takahashi2, Yuya Shirayama2, Shuntaro Yokosuka2, Chikatsu Iwase2, Tomohisa Sugo2, Akihiro Hayashi2, Kenta Kashimura2, Shun'ichiro Shimbori2, Hiroshi Tokumoto2, Tetsuo Shimizu1 (AIST1, Sanyu Co., Ltd.2)

Keywords:plasma、etching、laser