The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

06. Thin Films and Surfaces » 6.6 Probe microscopy

[29p-D3-1~20] 6.6 Probe microscopy

Fri. Mar 29, 2013 1:30 PM - 6:45 PM D3 (C5 3F-324)

[29p-D3-16] Dependence of Field Evaporation on the Crystallographic Orientation for Three-Dimensional Atom Probe

○(M2)Mahito Shimizu1, Masato Morita1, Hidenobu Nishizawa1, Yuya Hanaoka1, Hideki Kawakatsu1, Masanori Owari1,2 (Institute of Industrial Science, Univ. of Tokyo1, Environmental Science Center, Univ. of Tokyo2)

Keywords:アトムプローブ、AP、電界蒸発