[29p-D3-1~20] 6.6 Probe microscopy

[29p-D3-2] △Detection of tip-sample interaction using NC-AFM with a charge amplifier

^○Makoto Nogami¹, Toyoko Arai², Akira Sasahara¹, Masahiko Tomitori¹ (JAIST¹, Kanazawa Univ.²)

Keywords:電荷移動、チャージアンプ、NC-AFM