The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

15. Crystal Engineering » 15.8 Crystal evaluation, nanoimpurities and crystal defects

[29p-G16-1~21] 15.8 Crystal evaluation, nanoimpurities and crystal defects

Fri. Mar 29, 2013 1:30 PM - 7:15 PM G16 (B5 3F-2304)

[29p-G16-1] Objection to a Simulation for Intrinsic Point Defects in Silicon Crystals during Melt Growth

Takao Abe1, Toru Takaha1, Koun Shirai2 (Shinetsu Handotai1, Osaka Univ.2)

Keywords:シリコン結晶中の点欠陥