The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Poster presentation)

15. Crystal Engineering » 15.6 IV-group-based compounds

[29p-PB4-1~25] 15.6 IV-group-based compounds

Fri. Mar 29, 2013 1:30 PM - 3:30 PM PB4 (2nd gymnasium)

[29p-PB4-11] Short-Time Activation of Impurity in SiC Wafer by Atmospheric Pressure Thermal Plasma Jet Irradiation

Ryuhei Ashihara1, Hiroaki Hanafusa1, Hideki Murakami1, Shohei Hayashi1, Shunki Koyanagi1, Keisuke Maruyama1, Seiichiro Higashi1 (Hiroshima Univ.1)

Keywords:SiC、TPJ、活性化