The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis

[30a-B1-1~10] 7.2 Electron microscopes, evaluation, measurement and analysis

Sat. Mar 30, 2013 9:00 AM - 11:45 AM B1 (K2 3F-1301)

[30a-B1-2] ▼Image Processing for Phase Imperfections in Electron Holography

○(D)Wei Li1, Takayoshi Tanji1 (Nagoya University1)

Keywords:electron holography、phase information