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Oral presentation

Code-sharing session » 14.3/15.4 Code-sharing session

[17a-A27-1~11] 14.3/15.4 Code-sharing session

Wed. Sep 17, 2014 9:00 AM - 12:00 PM A27 (N302)

9:45 AM - 10:00 AM

△ [17a-A27-4] In-situ cross-sectional observation of operated SiC-DMOSFET using super-higher-order nonlinear dielectric microscopy

^○Norimichi Chinone¹, Yasuo Cho¹ (Tohoku Univ.¹)

Keywords:SiC,SNDM