[17p-A13-1~6] Ｘ線反射率，表面Ｘ線散乱による埋もれた界面の解析における位相問題 - 新光源への期待

▲ [17p-A13-2] Tomographic Micro-Imaging of Buried Layers and Interfaces with 15W X-ray Power Source

^〇（D）Jinxing Jiang^1,2，Kenji Sakurai^1,2 (University of Tsukuba¹, National Institute for Materials Science²)

キーワード：X-ray reflection, Tomography, Buried layers and interface, Imaging