Analysis of Delay Time Degradation of Ultra-Low Supply Voltage CMOS Circuit Operating in Subthreshold Region

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.4 Devices/Integration Technologies

Thu. Sep 18, 2014 9:00 AM - 12:00 PM A16 (E307)

9:45 AM - 10:00 AM

^○(D)Seung-Min Jung¹, Takuya Saraya¹, Masaharu Kobayashi¹, Toshiro Hiramoto¹ (IIS¹)

Keywords:Low power CMOS