Statistical Analysis of Random Telegraph Noise (RTN) in Linear Region and Saturation Region in Scaled Bulk Transistors

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.4 Devices/Integration Technologies

Thu. Sep 18, 2014 9:00 AM - 12:00 PM A16 (E307)

10:45 AM - 11:00 AM

^○Misumi Kawakami¹, Tomoko Mizutani¹, Takuya Saraya¹, Masaharu Kobayashi¹, Toshiro Hiramoto¹ (IIS, Univ. of Tokyo¹)

Keywords:RTN,MOSFET,ばらつき