The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

14. Semiconductors B (Exploratory Materials, Physical Properties, Devices) » 14.3 Electron devices and Process technology

[18a-A22-1~12] 14.3 Electron devices and Process technology

Thu. Sep 18, 2014 9:00 AM - 12:15 PM A22 (E314)

10:00 AM - 10:15 AM

[18a-A22-5] Relative Importance of Interface-Roughness Scattering and Alloy-Disorder Scattering in AlGaN/GaN HEMTs

Yoshihiro Akiyama1, Ryosuke Niwa1, Hiroyuki Sakaki1 (Toyota Technol. Inst.1)

Keywords:界面凹凸,合金,波動関数