Electronic States at Ultrathin SiO<sub>2</sub>/SiC Interface measured by Total Photoelectron Yield Spectroscopy

Presentation information

Oral presentation

15. Crystal Engineering » 15.6 IV-group-based compounds

Thu. Sep 18, 2014 2:00 PM - 5:15 PM A17 (E308)

2:15 PM - 2:30 PM

^○Akio Ohta¹, Daichi Takeuchi², Truyen Nguyen Xuan², Katsunori Makihara², Seiichi Miyazaki² (Nagoya Univ. VBL¹, Nagoya Univ.²)

Keywords:光電子分光