TOF-SIMS measurement of Ge directly grown on Si substrate(II)

Presentation information

Oral presentation

15. Crystal Engineering » 15.5 IV-group crystals and IV-IV-group mixed crystals

Fri. Sep 19, 2014 9:30 AM - 12:00 PM A16 (E307)

10:30 AM - 10:45 AM

^○Kenichiro KONO¹, Songbong PARK², Yasuhiko ISHIKAWA², Kazumi WADA² (NIMS¹, Univ. of Tokyo²)

Keywords:Si,Ge