The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

08. Plasma Electronics » 8.1 Plasma production and control

[19a-S8-1~11] 8.1 Plasma production and control

Fri. Sep 19, 2014 9:00 AM - 12:00 PM S8 (S8)

9:30 AM - 9:45 AM

[19a-S8-3] Dependence of multi-charged ion beam extracted from ECRIS on Ar gas pressure and emittance measurement

Youta Imai1, Masayuki Muramatsu2, Sho Kumakura1, Takuya Nishiokada1, Tomoki Nagaya1, Fuminobu Sato1, Yushi Kato1, Atsushi Kitagawa2, Toshiyuki Iida1 (Osaka Univ.1, NIRS2)

Keywords:ECRプラズマ