9:30 AM - 9:45 AM
[19a-S8-3] Dependence of multi-charged ion beam extracted from ECRIS on Ar gas pressure and emittance measurement
Keywords:ECRプラズマ
Oral presentation
08. Plasma Electronics » 8.1 Plasma production and control
Fri. Sep 19, 2014 9:00 AM - 12:00 PM S8 (S8)
9:30 AM - 9:45 AM
Keywords:ECRプラズマ