The 75th JSAP Autumn Meeting, 2014

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Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19p-A15-1~12] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Fri. Sep 19, 2014 1:30 PM - 4:45 PM A15 (E306)

4:15 PM - 4:30 PM

[19p-A15-11] Evaluation of Analog and I/O Characteristics in SOI FinFETs with High Thermal Conductivity BOX layer

○Tsunaki Takahashi1,2, Ken Uchida1,2 (Dept. Electronics and Electrical Eng., Keio Univ.1, CREST, JST2)

Keywords:FinFET,自己加熱効果