The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19p-A15-1~12] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Fri. Sep 19, 2014 1:30 PM - 4:45 PM A15 (E306)

4:30 PM - 4:45 PM

[19p-A15-12] Soft-error simulation with a model for radiation-induced increase in local temperature

Daisuke Kobayashi1,2, Taichi Ito1, Kazuyuki Hirose1,2 (ISAS/JAXA1, U. Tokyo2)

Keywords:ソフトエラー,放射線,シングルイベント効果