The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-A20-1~15] 15.8 Crystal evaluation, impurities and crystal defects

Sat. Sep 20, 2014 9:00 AM - 1:00 PM A20 (E312)

9:00 AM - 9:15 AM

[20a-A20-1] High sensitivity infrared absorption spectroscopy and infrared defect dynamics of silicon crystal (8) On irradiation induced intrinsic point defects and their clusters

Naohisa Inoue1,5, Yasunori Goto2, Hirofumi Seki3, Kaori Watanabe4, Yuichi Kawamura5 (Tokyo U. Agri. Technol.1, Royota Motor Co.2, Toray Research Center3, Systems Engineering Co.4, Osaka Pref. Univ.5)

Keywords:シリコン,赤外吸収,点欠陥