The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-A20-1~15] 15.8 Crystal evaluation, impurities and crystal defects

Sat. Sep 20, 2014 9:00 AM - 1:00 PM A20 (E312)

9:30 AM - 9:45 AM

[20a-A20-3] Effect of Low Carbon Concentration on Bulk Carrier Lifetime in MCZ Silicon Crystal

Mitsuo Higasa1, Yuta Nagai1, Satoko Nakagawa1, Kazuhiko Kashima1 (Global Wafers Japan Co.,Ltd.1)

Keywords:シリコン,ライフタイム,炭素