The 75th JSAP Autumn Meeting, 2014

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Oral presentation

15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-A20-1~15] 15.8 Crystal evaluation, impurities and crystal defects

Sat. Sep 20, 2014 9:00 AM - 1:00 PM A20 (E312)

10:45 AM - 11:00 AM

[20a-A20-8] An atomistic picture of the diffusion of two vacancies forming a di-vacancy in Si

○Eiji Kamiyama1, Koji Sueoka1 (Okayama Pref. Univ.1)

Keywords:シリコン,空孔