The 75th JSAP Autumn Meeting, 2014

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15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[20a-A20-1~15] 15.8 Crystal evaluation, impurities and crystal defects

Sat. Sep 20, 2014 9:00 AM - 1:00 PM A20 (E312)

11:15 AM - 11:30 AM

△ [20a-A20-9] Investigation of Si self-diffusion enhanced by the strain originated from end-of-range defects using isotope multilayers

○Taiga Isoda1, Masashi Uematsu1, Kohei Itoh1 (Keio Univ.1)

Keywords:TED,増速拡散,EOR defect