The 75th JSAP Autumn Meeting, 2014

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[20p-A10-1~8] 6.3 Oxide-based electronics

Sat. Sep 20, 2014 1:00 PM - 3:00 PM A10 (E214)

1:15 PM - 1:30 PM

[20p-A10-2] Investigation of the NiGe bottom electrode in CeO2 based ReRAM Devices

Jisong Jin1, Kuniyuki Kakushima2, Yoshinori Kataoka2, Akira Nishiyama2, Nobuyuki Sugii2, Hiroshi Wakabayashi2, Kazuo Tsutsui2, Kenji Natori1, Hiroshi Iwai1 (Tokyo Tech. FRC1, Tokyo Tech. IGSSE2)

Keywords:ReRAM,NiGe