Oral presentation

03. Optics » 3.4 Optical measurement

[17p-E4-1~17] 3.4 Optical measurement

Mon. Mar 17, 2014 1:15 PM - 5:45 PM E4 (E104)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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Lunch 11:45〜13:15 (11:45 AM - 1:15 PM)

1:15 PM - 1:30 PM

[17p-E4-1] Linearity test of Shack-Hartmann wave front sensor

^○Yoshichika Miwa¹, Takao Endo¹, Jiro Suzuki¹, Toshiyuki Ando¹ (Mitsubishi Electric Corporation¹)

1:30 PM - 1:45 PM

[17p-E4-2] Distance measurement using serodyne modulation and two-photon absorption process in Si-APD

^○Seiji Tominaka¹, Yosuke Tanaka¹, Takashi Kurokawa¹ (Tokyo Univ. of Agri. and Tech.¹)

1:45 PM - 2:00 PM

[17p-E4-3] Wide-range distance measurement using two-photon absorption process in Si-APD

^○Yoshimi Kudo¹, Taiki Hirasakura¹, Yosuke Tanaka¹, Takashi Kurokawa¹ (Tokyo Univ. of A&T¹)

2:00 PM - 2:15 PM

[17p-E4-4] Simultaneous measurement of temperature and static strain using FBG Fabry-Perot interferometer in polarization maintaining fiber

^○Ryoutarou Uchimura¹, Atsushi Wada¹, Shingo Tekuramori¹, Makoto Takeuchi¹, Osamu Tukida¹, Satoshi Tanaka¹, Nobuaki Takahashi¹ (National Defense Academy¹)

2:15 PM - 2:30 PM

[17p-E4-5] Fiber Sensor Network with Optical Power Supply Using Hybrid Node for Wired and Wireless Sensors

^○Shuhei Kobayashi¹, Keisuke Saitou¹, Yosuke Tanaka¹, Takashi Kurokawa¹ (Tokyo Univ. of Agri. and Tech.¹)

2:30 PM - 2:45 PM

[17p-E4-6] Enhancement of Data Transmission Rate in Fiber Sensor Network with Optical Power Supply

^○Akimasa Shiomichi¹, Yousuke Tanaka¹, Takashi Kurokawa¹ (Tokyo Univ. of Agri. and Tech.¹)

2:45 PM - 3:00 PM

△ [17p-E4-7] Demonstration of conversion ratio of optical direct conversion method for laser radar

^○Yuichi Nishino¹, Hidenobu Tsuji¹, Masaharu Imaki¹, Shumpei Kameyama¹ (Mitsubishi Electric Corporation¹)

3:00 PM - 3:15 PM

△ [17p-E4-8] Development of a balanced detection suited to simultaneous multi-wavelength measurements with noisy white-probe-light

^○Keisuke Seto^1,2, Toshiaki Tsukada³, Yoshinao Okuda⁴, Eiji Tokunaga⁴, Takayoshi Kobayashi^1,2 (UEC¹, CREST², Keisoku Solution³, Tokyo Univ. Sci.⁴)

3:15 PM - 3:30 PM

△ [17p-E4-9] Application of Optical Frequency Comb Synthesizer/Analyzer to 22.4 Tbit/s Composite Amplitude and Phase Shift Keying

^○Takayuki Miyamoto¹, Mitsutaka Ito¹, Toshiaki Yamazaki², Tatsutoshi Shioda¹ (Saitama Univ.¹, Nagaoka Univ. of Tech.²)

Break 15:30〜15:45 (3:30 PM - 3:45 PM)

3:45 PM - 4:00 PM

[17p-E4-10] Holographic three-dimensional motion detection of an optically trapped sub-100 nm gold nanoparticle

Akira Sato¹, Takumi Yanagawa¹, Kazufumi Goto¹, ^○Yoshio Hayasaki¹ (Utsunomiya Univ. CORE¹)

4:00 PM - 4:15 PM

[17p-E4-11] Measurement of size of ultrafine bubbles by various methods using light scattering

^○Hideaki Kobayashi¹, Masakazu Kashiwa¹, Shigeo Maeda¹, Toshihiro Fujita¹ (IDEC¹)

4:15 PM - 4:30 PM

▲ [17p-E4-12] Optical frequency comb profilometry using a single-pixel camera composed of digital micro-mirror devices

^○（P）Quang Duc Pham¹, Yoshio Hayasaki¹ (Utsunomiya University Center for Optical Research & Education (CORE)¹)

4:30 PM - 4:45 PM

[17p-E4-13] Surface profile measurement by a laser beam scanning interferometer using phase shift method.

^○Ayumu Funakubo¹, Osami Sasaki¹, Samuel Choi¹, Takamasa Suzuki¹ (Niigata Univ.¹)

4:45 PM - 5:00 PM

[17p-E4-14] Precision Surface Profile Measurement using White Light Interferometry with Tilting Reference Plane II

^○Shigeru Matsui¹, Yoshisada Ebata¹, Kenta Yaegashi¹, Akira Fujimoto¹ (Hitachi High-Technologies¹)

5:00 PM - 5:15 PM

[17p-E4-15] Film thickness measurement by using THz Time-Domain Spectroscopy

^○Motonobu Akagi¹, Keiko Kitagishi¹ (Otsuka Electronics Co.¹)

5:15 PM - 5:30 PM

[17p-E4-16] Development of thin metal film thickness measurement technique by pico second ultrasonic measurement using super short pulse fiber laser

^○Toshiyuki Nakao¹, Masahiro Watanabe¹, Hidekazu Tezuka², Hideaki Sasazawa², Yasuhiro Yoshitake², Hirotsugu Ogi³ (Hitachi, Ltd¹, Hitachi High-Technologies Corporation², Osaka University³)

5:30 PM - 5:45 PM

[17p-E4-17] Optical Measurements of SiC resistivity using by infrared laser

^○Akira Maekawa¹, Shigeyuki Takagi¹, Yasutomo Shiomi¹, Tsutomu Kakuno¹, Yasuhiro Akiyama¹ (Toshiba Corp.¹)