The 61st JSAP Spring Meeting, 2014

Presentation information

Poster presentation

15. Crystal Engineering » 15.6 IV-group-based compounds

[17a-PG3-1~15] 15.6 IV-group-based compounds

Mon. Mar 17, 2014 9:30 AM - 11:30 AM PG3 (G棟2階)

9:30 AM - 11:30 AM

[17a-PG3-11] Gamma Ray Irradiation Dose Dependence of Electrical Characterizations of SiC-MOS Capacitors

Kazuya Tanaka1, Takashi Yokoseki1, Natsuko Fujita2, Takahiro Makino2, Shinobu Onoda2, Takeshi Ohshima2, Yuki Tanaka3, Mikio Kandori3, Toru Yoshie3, Yasuto Hijikata1 (Saitama Univ.1, JAEA2, Sanken Electric Co., Ltd.3)

Keywords:SiC,ガンマ線,MOS