The 61st JSAP Spring Meeting, 2014

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Oral presentation

07. Beam Technology and Nanofabrication » 7.6 Ion beams

[17p-F4-1~13] 7.6 Ion beams

Mon. Mar 17, 2014 2:00 PM - 5:30 PM F4 (F304)

4:30 PM - 4:45 PM

[17p-F4-10] Secondary ion mass spectrometry with water cluster ion beam

○Shunichiro Nakagawa1, Toshio Seki1,2, Takaaki Aoki1,2, Jiro Matsuo1,2 (Kyoto Univ.1, JST-CREST2)

Keywords:クラスターイオン