The 61st JSAP Spring Meeting, 2014

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07. Beam Technology and Nanofabrication » 7.7 Vacuum nanoelectronics and electron sources

[17p-F5-1~15] 7.7 Vacuum nanoelectronics and electron sources

Mon. Mar 17, 2014 1:30 PM - 5:45 PM F5 (F305)

1:30 PM - 1:45 PM

[17p-F5-1] Electron emitter characterization by Scanning Probe Microscope

○Norimichi Watanabe1, Miyuki Tanaka1, Tetsuo Shimizu1 (NRI-AIST1)

Keywords:電子源,走査プローブ顕微鏡