10:15 AM - 10:30 AM
[18a-F5-6] The effect of non-linear total variation based denoising on TEM electron tomography tilt-series images
Keywords:電子線トモグラフィ,雑音除去
Presentation information
Oral presentation
07. Beam Technology and Nanofabrication » 7.2 Electron microscopes, evaluation, measurement and analysis
[18a-F5-1~11] 7.2 Electron microscopes, evaluation, measurement and analysis
Tue. Mar 18, 2014 9:00 AM - 12:00 PM F5 (F305)