In-situ electron holography of carrier accumulation at InGaZnO<sub>4</sub> /SiO<sub>2</sub> interface

Presentation information

Oral presentation

Joint Session K "Wide bandgap oxide semiconductor materials and devices" » Nanocarbon Technology

Tue. Mar 18, 2014 1:15 PM - 6:30 PM E10 (E204)

4:00 PM - 4:15 PM

^○Nobuyuki Ikarashi¹, Motofumi Saitoh¹, Hiroshi Takeda¹, Naoya Inoue¹, Hiroshi Sunamura¹, Kiyoshi Takeuchi¹, Masami Hane¹ (Renesas Electronics¹)

Keywords:酸化物半導体,電子線ホログラフィー,界面