TOF-SIMS measurement of Ge directly grown on Si substrate

Presentation information

Oral presentation

15. Crystal Engineering » 15.5 IV-group crystals and IV-IV-group mixed crystals

Tue. Mar 18, 2014 1:30 PM - 6:45 PM F6 (F306)

4:15 PM - 4:30 PM

^○Kenichiro KONO¹, Sungbong Park², Yasuhiko Ishikawa², Kazumi Wada² (NIMS, QBU¹, Univ. of Tokyo,²)

Keywords:Ge,TOF-SIMS