[18p-PA11-1~8] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

△ [18p-PA11-3] Microstructural analysis of ultra-low reflectivity Si surfaces fabricated by surface structure chemical transfer method

^○Wen Xie^1,2, Daichi Irishika^1,2, Takaaki Nonaka^1,2, Masao Takahashi^1,2, Kentaro Imamura^1,2, Hikaru Kobayashi^1,2 (ISIR, Osaka Univ.¹, CREST-JST²)

Keywords:極低反射率,シリコン-ナノクリスタル,屈折率