[18p-PA11-1~8] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[18p-PA11-4] Local Electrical Properties of Mn-Nanodots embedded SiOx MIM Diodes by Atomic Force Microscopy Using a Conducting Probe

^○Takashi Arai¹, Chong Liu¹, Akio Ohta², Katsunori Makihara¹, seiichi Miyazaki¹ (Nagoya Univ.¹, Nagoya Univ. VBL²)

Keywords:抵抗変化メモリ