The 61st JSAP Spring Meeting, 2014

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Poster presentation

15. Crystal Engineering » 15.3 III-V-group epitaxial crystals

[18p-PG6-1~15] 15.3 III-V-group epitaxial crystals

Tue. Mar 18, 2014 1:30 PM - 3:30 PM PG6 (G棟2階)

1:30 PM - 3:30 PM

[18p-PG6-10] In-situ reflectivity measurement under growth of GaAs/InGaAs buffer on silicon

○Masakazu Arai1, Ryo Nakazo1, Ryuzo Iga1, Masaki Kohtoku1 (NTT Photonics Lab.1)

Keywords:メタモルフィック,シリコン