Analysis of surface states with a charge amplifier installed in NC-AFM

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

Wed. Mar 19, 2014 9:00 AM - 12:15 PM D5 (D207)

9:45 AM - 10:00 AM

^○Makoto Nogami¹, Toyoko Arai², Akira Sasahara¹, Masahiko Tomitori¹ (JAIST¹, Kanazawa Univ.²)

Keywords:NC-AFM,チャージアンプ,接触電位差