The 61st JSAP Spring Meeting, 2014

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13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19a-D9-1~13] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Wed. Mar 19, 2014 9:00 AM - 12:30 PM D9 (D315)

11:45 AM - 12:00 PM

[19a-D9-11] Characterization of Electronic Charged States of Self-Aligned Coupled Si Quantum Dots by AFM/KFM Probe Technique

○Naoki Tsunekawa1, Katsunori Makihara1, Mitsuhisa Ikeda2, Seiichi Miyazaki1 (Nagoya Univ.1, Hiroshima Univ.2)

Keywords:Siナノ構造,AFM/KFM