The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19a-D9-1~13] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Wed. Mar 19, 2014 9:00 AM - 12:30 PM D9 (D315)

9:30 AM - 9:45 AM

[19a-D9-3] Evaluation Methods for Water Permeation into Fine Pore Patterns

Mieko Kashi1, Takuya Kambayashi1, Masaki Okawa2, Megumi Hamano1, Toshinori Jin'oka1, Hiroki Takahashi1, Katsuhiro Ota1, Tomonori Saeki1 (Hitachi Yokohama Research Lab.1, Kokusai Electric Semiconductor Service2)

Keywords:微細孔,液浸入,蛍光