An all-optical UHV atomic force microscopy for chemical contrast in lateral mode.

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

Wed. Mar 19, 2014 1:45 PM - 5:15 PM D5 (D207)

5:00 PM - 5:15 PM

^○（PC）Damiron Denis^1,2, Allain Pierre^1,2, Toriyama Yohei¹, Miyazaki Yuta¹, Kobayashi Dai¹, Kawakatsu Hideki¹ (IIS¹, LIMMS²)

Keywords:AFM,Chemical Contrast,Lateral Forces