The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

[19p-D9-1~18] 13.1 Basic Properties, Surface and Interface Phenomena, and Simulation

Wed. Mar 19, 2014 2:00 PM - 7:00 PM D9 (D315)

3:00 PM - 3:15 PM

[19p-D9-5] Excitations of LO/TO Phonons in Thin Strained-SiGe Layer Using Surface Enhanced Raman Spectroscopy

Shotaro Yamamoto1, Daisuke Kosemura1, Siti Norhidayah Mohd Yusoff1, Takahiro Kijima1, Ryosuke Imai1, Koji Usuda2, Atsushi Ogura1 (Meiji Univ.1, AIST-GNC2)

Keywords:SiGe,表面増強ラマン分光法,歪