The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[19p-E8-1~21] 6.3 Oxide-based electronics

Wed. Mar 19, 2014 1:15 PM - 6:45 PM E8 (E202)

3:15 PM - 3:30 PM

[19p-E8-9] Characterization of NiO thin films by a reactive-sputtering method with a pair of facing Ni targets

○(M1)yasuaki furuya1, mai kawai2, tokahiro nomoto2, nozomu tsuboi2,3 (Grad. School of Sci. and Tech., Niigata Univ.1, Fac. of Eng., Niigata Univ.2, Cen. for Trans. Research, Niigata Univ.3)

Keywords:透明導電性酸化物