2:00 PM - 2:15 PM
[19p-F6-1] Interface trap generation at SiO2/Si structure by CHxFy plasma etching
Keywords:エッチング,ダメージ,プラズマ
Oral presentation
08. Plasma Electronics » 8.4 Plasma etching
Wed. Mar 19, 2014 2:00 PM - 7:00 PM F6 (F306)
2:00 PM - 2:15 PM
Keywords:エッチング,ダメージ,プラズマ