The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[19p-F9-1~17] 15.8 Crystal evaluation, impurities and crystal defects

Wed. Mar 19, 2014 1:00 PM - 5:45 PM F9 (F401)

2:00 PM - 2:15 PM

[19p-F9-5] The mechanism of dopant diffusion in Si crystals

Masashi Suezawa1, Kaihei Inoue1, Yoshiaki Iijima1, Ichiro Yonenaga1 (Tohoku Univ., IMR1)

Keywords:拡散機構,シリコン結晶,ドーパント