The 61st JSAP Spring Meeting, 2014

Presentation information

Oral presentation

15. Crystal Engineering » 15.8 Crystal evaluation, impurities and crystal defects

[19p-F9-1~17] 15.8 Crystal evaluation, impurities and crystal defects

Wed. Mar 19, 2014 1:00 PM - 5:45 PM F9 (F401)

3:15 PM - 3:30 PM

[19p-F9-9] High sensitivity infrared absorption spectroscopy and infrared defect dynamics of silicon crystal (7) Detection of dark matters and UFO– Infrared defect astronomy

Naohisa Inoue1,5, Yasunori Goto2, Hirofumi Seki3, Kaori Watanabe4, Yuichi Kawamura5 (Tokyo Univ. Agr. & Technol.1, Toyota Motor Co.2, Toray Research Center3, Systems Engineering Inc.4, Osaka Pref. Univ.5)

Keywords:シリコン,粒子線照射,赤外吸収