Investigation of AlxOy ReRAM Cell Resistance Switch Characteristic

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.4 Devices/Integration Technologies

Thu. Mar 20, 2014 9:00 AM - 12:30 PM F12 (F408)

11:15 AM - 11:30 AM

^○Sheyang Ning^1,2, Ogura Tomoko Iwasaki¹, Ken Takeuchi¹ (Chuo Univ.¹, Univ. of Tokyo²)

Keywords:ReRAM,Verify-program,Endurance