The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[13p-2H-1~21] 6.3 Oxide electronics

Sun. Sep 13, 2015 1:45 PM - 7:15 PM 2H (222)

座長:矢嶋 赳彬(東大),藤原 宏平(東北大)

2:00 PM - 2:15 PM

[13p-2H-2] Atomic resolution imaging of LaAlO3(100) using non-contact atomic force microscopy

〇daiki katsube1, yutaro takase1, hayato yamashita1, satoshi abo1, fujio wakaya1, masayuki abe1 (1.Osaka Univ.)

Keywords:atomic force microscopy,surface