The 76th JSAP Autumn Meeting, 2015

Presentation information

Oral presentation

13 Semiconductors » 13.4 Si wafer processing /MEMS/Integration technology

[14p-1C-1~16] 13.4 Si wafer processing /MEMS/Integration technology

Mon. Sep 14, 2015 1:15 PM - 5:30 PM 1C (135)

座長:中村 友二(富士通研),筑根 敦弘(大陽日酸)

2:45 PM - 3:00 PM

[14p-1C-7] Printing deposition of thin Cu films under-short-distance irradiation of ballistic electrons

〇Ryutaro Suda1, Mamiko Yagi1, Akira Kojima1, Jun-ichi Shirakashi1, Nobuyoshi Koshida1 (1.Tokyo Univ. of Agri. & Technol.)

Keywords:electron emitter,thin film deposition,reduction

Ballistic hot electrons emitted from a nanocrystalline silicon (nc-Si) diode induce reducing effects in salt solutions, leading to deposition of metal or semiconductor thin films. Based on previously reported thin film deposition under dipping and dripping modes in which thin films are deposited on the surface of the nc-Si emitter, we have developed a printing mode. A target substrate is separately located in close proximity to the emitter, and then emitted electrons impinge upon solutions coated on the substrate. It is demonstrated here that thin Cu films can be deposited on oxidized Si substrates.