[15a-4E-1~7] 7.1 X-ray technologies

▲ [15a-4E-1] X-ray phase scanner using Talbot-Lau interferometry for non-destructive testing

〇(P)Shivaji Bachche¹, Masahiro Nonoguchi², Koichi Kato², Masashi Kageyama², Takafumi Koike², Masaru Kuribayashi², Atsushi Momose¹ (1.Tohoku Univ., 2.Rigaku Corp.)

Keywords:Phase contrast,X-ray phase imaging,X-ray grating

X-ray grating interferometry has a great potential for X-ray phase-contrast imaging over conventional X-ray absorption-contrast imaging which does not provide significant contrast for weakly absorbing objects and soft biological tissues. This paper demonstrates the development and overview of an X-ray phase scanner with which objects moving across the field of view are imaged with the scheme of X-ray phase imaging. An apparatus consisting of an X-ray source that emits X-rays vertically, optical gratings, and a photon-counting X-ray image detector and its imaging performance will be reported.